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Werner Frammelsberger

University of the West of England

5

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91

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Intermittent contact scanning capacitance microscopy-An improved method for 2D doping profiling

2005 Microelectronics Reliability
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Simplified tunnelling current calculation for MOS structures with ultra-thin oxides for conductive atomic force microscopy investigations

2005 Materials Science and Engineering B-advanced Functional Solid-state Materials
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New trends in the application of Scanning Probe Techniques in Failure Analysis

2004 Microelectronics Reliability
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Characterization of thin and ultra-thin SiO2 films and SiO2/Si interfaces with combined conducting and topographic atomic force microscopy

2003 Microelectronics Reliability
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