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Hui-Wen Yuan
Hui-Wen Yuan
Fudan University
Gate dielectric
Electronic engineering
Chemistry
MOSFET
Analytical chemistry
6
Papers
16
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PBTI Investigation of MoS2 n-MOSFET With Al2O3 Gate Dielectric
2017
IEEE Electron Device Letters
Hui-Wen Yuan
Hui Shen
Jun Jie Li
Jinhai Shao
Daming Huang
Yifang Chen
Pengfei Wang
Shao-Feng Ding
Albert Chin
Ming-Fu Li
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Citations (7)
PBTI Investigation of MoS2n-MOSFET With Al2O3Gate Dielectric
2017
IEEE Electron Device Letters
Hui-Wen Yuan
Hui Shen
Jun Jie Li
Jinhai Shao
Daming Huang
Yifang Chen
Pengfei Wang
Shao-Feng Ding
Albert Chin
Ming-Fu Li
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Low frequency noise characteristics in p-Type MOSFET with multilayer WSe 2 channel and Al 2 O 3 back gate dielectric
2017
ASICON | International Conference on ASIC
Hui Shen
Hui-Wen Yuan
Sitong Bu
Mingyue He
Daming Huang
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Trapping and detrapping of oxide border traps in Al2O3 gate dielectric in MoS2 n-MOSFETs under PBTI stress
2016
ICSICT | IEEE International Conference on Solid-State and Integrated Circuit Technology
Hui-Wen Yuan
Hui Shen
Jun Jie Li
Jinhai Shao
Daming Huang
Yifang Chen
Pengfei Wang
Shao-Feng Ding
Albert Chin
Ming-Fu Li
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Investigation of Traps at MoS 2 /Al 2 O 3 Interface in nMOSFETs by Low-Frequency Noise
2016
IEEE Electron Device Letters
Hui-Wen Yuan
Hui Shen
Jun Jie Li
Jinhai Shao
Daming Huang
Yifang Chen
Pengfei Wang
Shi-Jin Ding
Wen-Jun Liu
Albert Chin
Ming-Fu Li
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Citations (8)
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