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Mark Spinelli
Mark Spinelli
Engineering
Real-time computing
Bitmap
Leakage (electronics)
Bayes' theorem
2
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3
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0
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AUTOMATED DEFECT PATTERN RECOGNITION: AN APPROACH TO DEFECT CLASSIFICATION AND LOT CHARACTERIZATION
2002
Student Team
Megan Guise
Kimberly Poe
Josh Stafford
Andrew Wahba
Faculty Advisors
K. Preston White
Christina Mastrangelo
Richard R. Newcomer
Mark Spinelli
Dominion Semiconductor
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Citations (3)
In-line defect to final test bitmap correlations : A Bayesian approach
2001
Mark Spinelli
K. Preston White
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