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S. Guagliardo
S. Guagliardo
University of Montpellier
Optoelectronics
CMOS
Cathode
Materials science
Anode
3
Papers
6
Citations
0
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Single-Event Latchup sensitivity: Temperature effects and the role of the collected charge
2021
Microelectronics Reliability
S. Guagliardo
Frédéric Wrobel
Y. Q. Aguiar
J.L. Autran
Paul Leroux
Frédéric Saigné
Vincent Pouget
A. D. Touboul
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Effect of Temperature on Single Event Latchup Sensitivity
2020
S. Guagliardo
Frédéric Wrobel
Y. Q. Aguiar
J.L. Autran
Paul Leroux
Frédéric Saigné
Vincent Pouget
Antoine Touboul
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Radiation hardening efficiency of gate sizing and transistor stacking based on standard cells
2019
Microelectronics Reliability
Y. Q. Aguiar
Frédéric Wrobel
S. Guagliardo
J.L. Autran
Paul Leroux
Frédéric Saigné
Antoine Touboul
Vincent Pouget
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Citations (5)
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