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Michal Pawlak

Nicolaus Copernicus University in Toruń

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Quantitative Imaging of Defect Distributions in CdZnTe Wafers Using Combined Deep-Level Photothermal Spectroscopy, Photocarrier Radiometry, and Lock-In Carrierography

2021
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Nonlinear Dependence of Photocarrier Radiometry Signals from p- Si Wafers on Optical Excitation Intensity

2007 Journal of The Electrochemical Society
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