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Stephen W. Thayer
Stephen W. Thayer
Materials science
Structured light
Ground support equipment
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4
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Optoelectronic Instruments For Analysis Of Surface Defects
1995
J. David Collins
Robert P. Mueller
Richard M. Davis
Stuart M. Gleman
Carl G. Hallberg
Stephen W. Thayer
David L. Thompson
James E. Thompson
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Structured light microscopy for surface detect analyses
1994
David L. Thompson
Stuart M. Gleman
Carl G. Hallberg
Stephen W. Thayer
J. D. Collins
Richard M. Davis
Robert P. Mueller
Paul A. Schwindt
David C. Noble
Phil F. Vanaria
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Paper Session I-C - Non-Destructive Detection of Corrosion Under Paint on Critical Surfaces
1994
H. N. Delgado
J. D. Collins
M. J. Verdier
Stuart M. Gleman
Stephen W. Thayer
C. H. Hallberg
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Paper Session II-B - 3-Dimensional Feature Mapping Using Spatial Spectral Analysis
1994
Stephen W. Thayer
Stuart M. Gleman
J.E. Thompson
H. N. Delgado
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