Old Web
English
Sign In
Acemap
>
authorDetail
>
Taiho Yoshinaka
Taiho Yoshinaka
High-κ dielectric
Annealing (metallurgy)
Flash-lamp
trap density
Materials science
2
Papers
0
Citations
0
KQI
Citation Trend
Filter By
Interval:
1900~2024
1900
2024
Author
Papers (1)
Sort By
Default
Most Recent
Most Early
Most Citation
No data
Journal
Conference
Others
Interface trap density of high-k gate stack using Flash Lamp Annealing (FLA) under NH 3 ambient
2018
The Japan Society of Applied Physics
Kodai Shuto
Taiho Yoshinaka
Ryo Suemasa
Hikaru Kawarazaki
Takayuki Aoyama
Shinichi Kato
Yasuo Nara
Show All
Source
Cite
Save
Citations (0)
1