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Scott Yu
Scott Yu
Semiconductor Manufacturing International Corporation
Electronic engineering
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Physics
Circuit design
Electrical engineering
3
Papers
46
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DTMOS mode as an effective solution of RTN suppression for robust device/circuit co-design
2014
IEDM | International Electron Devices Meeting
Shaofeng Guo
Ru Huang
Peng Hao
Mulong Luo
Pengpeng Ren
Jianping Wang
Weihai Bu
Jingang Wu
Waisum Wong
Scott Yu
Hanming Wu
Shiuh-Wuu Lee
Runsheng Wang
Yangyuan Wang
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Citations (5)
New observations on complex RTN in scaled high-κ/metal-gate MOSFETs — The role of defect coupling under DC/AC condition
2013
IEDM | International Electron Devices Meeting
Pengpeng Ren
Peng Hao
Changze Liu
Runsheng Wang
Xiaobo Jiang
Yingxin Qiu
Ru Huang
Shaofeng Guo
Mulong Luo
Jibin Zou
Meng Li
Jianping Wang
Jingang Wu
Jinhua Liu
Weihai Bu
Waisum Wong
Scott Yu
Hanming Wu
Shiuh-Wuu Lee
Yangyuan Wang
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Citations (14)
A unified approach for trap-aware device/circuit co-design in nanoscale CMOS technology
2013
IEDM | International Electron Devices Meeting
Runsheng Wang
Mulong Luo
Shaofeng Guo
Ru Huang
Changze Liu
Jibin Zou
Jianping Wang
Jingang Wu
Nuo Xu
Waisum Wong
Scott Yu
Hanming Wu
Shiuh-Wuu Lee
Yangyuan Wang
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Citations (27)
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