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Bo Krsnik
Bo Krsnik
Test compression
Amplifier
Stress testing
Very-large-scale integration
Automatic test pattern generation
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Flexible test mode approach for 256-Mb DRAM
1997
IEEE Journal of Solid-state Circuits
Toshiaki Kirihata
Hing Wong
John K. DeBrosse
Yohji Watanabe
T. Hara
Munehiro Yoshida
Matthew R. Wordeman
Shuso Fujii
Yoshiaki Asao
Bo Krsnik
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Citations (10)
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