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Henning Stoschus

6

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High voltage scanning electron microscope overlay metrology accuracy for after development inspection

2021
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Simulation-based artifact correction (SBAC) for metrological computed tomography

2017 Measurement Science and Technology
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Procédé et dispositif de tomodensitométrie pour une pièce

2015
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Apparatus and method for measuring characteristics at or workpieces with computed tomography

2015
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Electron Transport in the Plasma Edge with Rotating Resonant Magnetic Perturbations at the TEXTOR Tokamak

2011
- Henning Stoschus
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