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C.C.-W. Yu
C.C.-W. Yu
Michigan State University
Noise (electronics)
bias stress
degradation
Electromigration
Materials science
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BJT forward bias degradation effects and mechanisms: A gain and noise study
1993
C. Jack Sun
Timothy A. Grotjohn
C.J. Huang
Donnie K Reinhard
C.C.-W. Yu
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