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M. Bejar
M. Bejar
École centrale de Lyon
Photoluminescence
Optoelectronics
Physics
Analytical chemistry
Strain (chemistry)
7
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21
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New Scanning Photoluminescence Technique for Quantitative Mapping the Surface Recombination Velocity in InP and Related Materials
1999
Japanese Journal of Applied Physics
Stanislas Krawczyk
M. Bejar
Abdelaziz Khoukh
Robert Blanchet
Bernard Sermage
Delong Cui
Dimitris Pavlidis
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Citations (6)
New scanning photoluminescence technique for quantitative mapping the surface recombination velocity in InP and related materials
1998
IPRM | International Conference on Indium Phosphide and Related Materials
S.K. Krawczyk
M. Bejar
R.C. Blanchet
A. Khoukh
Bernard Sermage
Delong Cui
D. Pavlidis
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Citations (1)
Room temperature scanning photoluminescence for mapping the lifetime and the doping density in epitaxial layers
1997
Materials Science and Engineering B-advanced Functional Solid-state Materials
M.F. Nuban
S.K. Krawczyk
M. Bejar
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New scanning photoluminescence technique for mapping the lifetime and the doping density: application to carbon doped InGaAs/InP layers and heterostructures
1997
IPRM | International Conference on Indium Phosphide and Related Materials
S.K. Krawczyk
M. Bejar
M.F. Nuban
R.C. Blanchet
Bernard Sermage
J.L. Benchimol
K. Dong
Delong Cui
D. Pavlidis
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Citations (3)
1