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Kevin McCauley
Kevin McCauley
IBM
Computer science
Electronic engineering
Real-time computing
Design for testing
Computer engineering
4
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95
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Scan is Good Enough for Stuck Fault, Why Not AC Scan for Delay Faults
2001
ITC | International Test Conference
Kevin McCauley
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ATPG in practical and non-traditional applications
1998
ITC | International Test Conference
Brion L. Keller
Kevin McCauley
Joseph Swenton
James Youngs
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Delay test of chip I/Os using LSSD boundary scan
1998
ITC | International Test Conference
Pamela S. Gillis
Francis Woytowich
Kevin McCauley
Ulrich Baur
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Citations (41)
Delay Test: The Next Frontier for LSSD Test Systems
1992
ITC | International Test Conference
B. Konemann
J. Barlow
P. Chang
Vijay S. Iyengar
Barry K. Rosen
Thomas W. Williams
R. Gabrielson
C. Goertz
Brion L. Keller
Kevin McCauley
J. Tischer
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Citations (46)
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