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Derek H. Leu
Derek H. Leu
IBM
Metal gate
Electronic engineering
Logic gate
Gate dielectric
Engineering
2
Papers
25
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Oxygen vacancy traps in Hi-K/Metal gate technologies and their potential for embedded memory applications
2015
IRPS | International Reliability Physics Symposium
Chandrasekharan Kothandaraman
X. Chen
Dan Moy
D. Lea
Sami Rosenblatt
Faraz Khan
Derek H. Leu
Toshiaki Kirihata
Dimitris P. Ioannou
G. LaRosa
J. B. Johnson
Norman Robson
Subramanian S. Iyer
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Citations (11)
3D stackable 32nm High-K/Metal Gate SOI embedded DRAM prototype
2011
VLSIC | Symposium on VLSI Circuits
John Golz
John M. Safran
Bishan He
Derek H. Leu
Ming Yin
Todd Weaver
Adis Vehabovic
Yan Sun
Alberto Cestero
Ben Himmel
Gary W. Maier
Chandrasekharan Kothandaraman
Daniel Jacob Fainstein
John E. Barth
Norman Robson
Toshiaki Kirihata
Ken Rim
Subramanian S. Iyer
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Citations (14)
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