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Wei-Yi Cao

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Observation of single event burnout (SEB) in an SOI NLDMOSFET using a pulsed laser

2021 Microelectronics Reliability
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Laser Simulation of Transient Ionizing Radiation Effects in the Double-Power Integrated Circuit

2020
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TID-Induced Off-State Leakage Current in Partially Radiation-Hardened SOI LDMOS

2020 IEEE Transactions on Nuclear Science
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TID-Induced Breakdown Voltage Degradation in Uniform and Linear Variable Doping SOI p-LDMOSFETs

2019 IEEE Transactions on Nuclear Science
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