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Nanbo Gong

Peking University

5

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30

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Causes of ferroelectricity in HfO$_{2}$-based thin films: An $\textit{ab initio}$ perspective.

2019 arXiv: Materials Science
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New insights into AC RTN in scaled high-к / metal-gate MOSFETs under digital circuit operations

2012 VLSIT | Symposium on VLSI Technology
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On the AC random telegraph noise (RTN) in MOS devices: An improved multi-phonon based model

2012 ICSICT | IEEE International Conference on Solid-State and Integrated Circuit Technology
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