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Kyung Joon Kim
Kyung Joon Kim
Korea Research Institute of Standards and Science
Chemistry
Analytical chemistry
Round robin test
Saturation (chemistry)
Wafer
3
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Final report on VAMAS round‐robin study to evaluate a correction method for saturation effects in DSIMS
2015
Surface and Interface Analysis
Akio Takano
Hidehiko Nonaka
Yoshikazu Homma
Mitsuhiro Tomita
Atsushi Murase
Syunichi Hayashi
M. Barozzi
Kyung Joon Kim
D. E. Sykes
David S. Simons
Joe Bennett
Charles W. Magee
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VAMAS round‐robin study to evaluate a correction method for saturation effects in D‐SIMS
2014
Surface and Interface Analysis
Akio Takano
Hidehiko Nonaka
Yoshikazu Homma
Mitsuhiro Tomita
Atsushi Murase
Syunichi Hayashi
M. Barozzi
Kyung Joon Kim
D. E. Sykes
David S. Simons
Joe Bennett
Charles W. Magee
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Simultaneous achievement of high-quality oxide passivation of nc-Si and suppression of Er de-activation by silicon-rich silicon oxide / Er-doped silicon nitride multilayers
2008
GFP | International Conference on Group IV Photonics
In Yong Kim
Jung H. Shin
Kyung Joon Kim
Moonseung Yang
Yoon-dong Park
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