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Royston Hugh Hogan
Royston Hugh Hogan
GlobalFoundries
Oxide
Wafer
Silicon
Materials science
Crystal
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Crystalline defect formation on aluminum bond pads during CMOS wafer storage and process strategies for defect elimination
2018
Journal of Vacuum Science & Technology. B. Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena
Santosh Kumar Pani
Royston Hugh Hogan
Madhavan Pandurangan
Ramesh Rao Nistala
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EEPROM retention performance modulation by poly Si grain size & dopant distribution
2016
ISSM | International Symposium on Semiconductor Manufacturing
Guai Guan Hong
Zheng Ke
Tang Pey Chyi
Li Yongan
Zhou Min
Royston Hugh Hogan
Chandrasekar Venkataramani
Pak Koesun
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