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M. V. Epov
M. V. Epov
Ellipsometry
Reflection coefficient
Nanostructure
Refractive index
Semiconductor
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Multiangular and Spectral Ellipsometry for Semiconductor Nanostructures Classification
2014
A.A. Goloborodko
M. V. Epov
L. Y. Robur
T. V. Rodionova
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Citations (5)
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