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R. Jerome
R. Jerome
ON Semiconductor
Image sensor
Electronic engineering
CMOS
Time-dependent gate oxide breakdown
Engineering
2
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4
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0
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Non-contact C-V and photoluminscence measurements for More-than-Moore SOI devices
2021
ASMC | Advanced Semiconductor Manufacturing Conference
Jeff Gambino
D. Price
R. Jerome
H. Ziad
T. Frank
A Kerekes
V. Samu
A. Ross
Zoltán Kiss
J. Byrnes
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Device reliability for CMOS image sensors with backside through-silicon vias
2018
IRPS | International Reliability Physics Symposium
Jeff Gambino
H. Soleimani
I. Rahim
B. Riebeek
Lieyi Sheng
G. Hosey
H. Truong
Gavin D. R. Hall
R. Jerome
D. Price
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Citations (4)
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