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Yann Turcant
Yann Turcant
Thin film
Porosity
Microelectronics
Analytical chemistry
Materials science
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Ellipsometric Porosimetry : Fast and Non Destructive Characterization for a Range of Porous Thin Films; Highlights on Energy and Microelectronic Applications.
2008
Christine Walsh
Alexis Bondaz
Yann Turcant
Aléxis Bourgeois
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