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K.G. Standing

Curie Institute

Thin film
Secondary ion mass spectrometry
Monolayer
Analytical chemistry
Static secondary-ion mass spectrometry

2

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31

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Variation of yield with thickness in SIMS and PDMS: Measurements of secondary ion emission from organized molecular films

1988 Nuclear Instruments & Methods in Physics Research Section B-beam Interactions With Materials and Atoms
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Citations (31)
Secondary ion emission from organized molecular films

1988
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