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D Guarrera

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Introduction of a New Conventional SEM: JSM-IT300LV:The Observation of a Water Containing Specimen With a Cooling Stage at 650 Pa

2014 Microscopy and Microanalysis
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Rapid Observation with an Atmospheric Scanning Electron Microscope

2011 Microscopy and Microanalysis
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Is “There an App for That?” Take a Look at the New Portable Scanning Electron Microscopes

2011 Microscopy and Microanalysis
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The New Atmospheric Scanning Electron Microscope allows in situ observation of dynamic phenomena under atmospheric pressure

2010 Microscopy and Microanalysis
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