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Ankur Arya

GlobalFoundries

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Electronic engineering
Leakage (electronics)
Static random-access memory
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3

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8

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An Extrinsic Device and Leakage Mechanism in Advanced Bulk FinFET SRAM

2019 IEEE Transactions on Very Large Scale Integration Systems
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Innovative use of FA techniques SCM and OBIRCH along with TCAD to resolve junction scaling issues at advanced technology nodes

2018 ASMC | Advanced Semiconductor Manufacturing Conference
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