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E. Kinsbron
E. Kinsbron
National Semiconductor
Engineering
Electromigration
Thin film
Electronic engineering
Very-large-scale integration
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Electromigration behavior analysis of aluminum alloys thin film conductors using maximum likelihood methods
1992
Microelectronics Reliability
E.A. Weis
E. Kinsbron
M.M. Snyder
B. Vogel
N. Croitoru
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