Old Web
English
Sign In
Acemap
>
authorDetail
>
V Todt
V Todt
Mitsubishi Corporation
Scattering
X-ray crystallography
Doping
Crystallography
Diffraction
1
Papers
8
Citations
0.00
KQI
Citation Trend
Filter By
Interval:
1900~2024
1900
2024
Author
Papers (1)
Sort By
Default
Most Recent
Most Early
Most Citation
No data
Journal
Conference
Others
X-ray diffraction study of defect distribution in Czochralski grown silicon highly doped by As
2005
Journal of Physics D
R. N. Kyutt
I. L. Shulpina
G. N. Mosina
V. V. Ratnikov
L M Sorokin
M. P. Scheglov
S S Ruvimov
J Kearns
V Todt
Show All
Source
Cite
Save
Citations (8)
1