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Kazuma Yamamoto
Kazuma Yamamoto
Tohoku University
Oxide
Semiconductor device
Analytical chemistry
Dielectric strength
Breakdown voltage
1
Papers
7
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Silicon Wafer Orientation Dependence of Metal Oxide Semiconductor Device Reliability
1994
Japanese Journal of Applied Physics
K. Nakamura
K. Ohmi
Kazuma Yamamoto
K. Makihara
Tadahiro Ohmi
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Citations (7)
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