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H. Aono

Renesas Electronics

8

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88

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A new aspect of time-dependent clustering model for non-uniform dielectric TDDB

2016 IRPS | International Reliability Physics Symposium
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A Coarse-Graining Approach to Rate Equations of the Composite AC-NBTI Model

2015 IEEE Transactions on Electron Devices
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Modeling of NBTI saturation effect and its impact on electric field dependence of the lifetime

2005 Microelectronics Reliability
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Modeling of NBTI degradation and its impact on electric field dependence of the lifetime

2004 IRPS | International Reliability Physics Symposium
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NBT-induced hot carrier (HC) effect: positive feedback mechanism in p-MOSFET's degradation

2002 IRPS | International Reliability Physics Symposium
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Citations (9)