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K. H. Cno
K. H. Cno
Thermal treatment
Radiochemistry
Positron annihilation spectroscopy
Wafer
Inorganic chemistry
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The Influence of Thermal Treatment on Defect Characteristics in Cz-Silicon Wafers Investigated by Positron Annihilation Spectroscopy
1992
MRS Proceedings
P. Mascher
W. Puff
S. Hahn
K. H. Cno
B Y Lee
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