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Yasunobu Yanagisawa
Yasunobu Yanagisawa
Hitachi
Ion implantation
Silicon
Leakage (electronics)
Analytical chemistry
Wet oxidation
3
Papers
13
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Leakage current evaluation for pn junctions formed in DC and RF MeV ion implanted wells
1996
Journal of Stroke & Cerebrovascular Diseases
Yasunobu Yanagisawa
Mitsuharu Honda
Makota Ogasawara
Nobuyoshi Natsuaki
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Physical model of bit-to-bit variation in data retention time of DRAMs
1995
DRC | Device Research Conference
Makoto Ogasawara
Y. Ito
M. Muranaka
Yasunobu Yanagisawa
Yoshitaka Tadaki
Nobuyoshi Natsuaki
T. Nagata
Y. Miyai
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Citations (7)
1