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Paul Pfäffli
Paul Pfäffli
Synopsys
Electronic engineering
Engineering
Technology CAD
Physics
Chip
6
Papers
21
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TCAD modeling for reliability
2018
Microelectronics Reliability
Paul Pfäffli
Hiu Yung Wong
X. Xu
L. Silvestri
X. W. Lin
T. Yang
Ravi Tiwari
S. Mahapatra
Steve Motzny
Victor Moroz
T. Ma
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Citations (3)
New integrated Monte Carlo code for the simulation of high-resolution scanning electron microscopy images for metrology in microlithography
2014
Proceedings of SPIE
Emre Ilgüsatiroglu
Alexey Yu. Illarionov
Mauro Ciappa
Paul Pfäffli
Lars Bomholt
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Citations (7)
TCAD for reliability
2012
Microelectronics Reliability
Paul Pfäffli
P. Tikhomirov
Xiaowei Xu
I. Avci
Yong-Seog Oh
P. Balasingam
S. Krishnamoorthy
Ting Ma
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Citations (7)
Efficient full-flow process simulation for 3D structures including stress modeling
2007
Journal of Computational Electronics
Alp H. Gencer
Andrei Lebedev
Paul Pfäffli
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Modeling of Cross-Talk Effects in Floating-Gate Devices Using TCAD Simulations
2006
SISPAD | International Conference on Simulation of Semiconductor Processes and Devices
Yv. Saad
Mauro Ciappa
Paul Pfäffli
Lars Bomholt
Wolfgang Fichtner
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Citations (2)
1