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Andrea Mazzocchi
Andrea Mazzocchi
Dielectric strength
Drain-induced barrier lowering
Gate dielectric
Leakage (electronics)
Gate oxide
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Influence of dielectric breakdown on MOSFET drain current
2005
IEEE Transactions on Electron Devices
Giorgio Cellere
A. Paccagnella
Andrea Mazzocchi
M.G. Valentini
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