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E. Principe
E. Principe
TESCAN
Analytical chemistry
Ion
Time of flight
Mass spectrum
Scanning electron microscope
2
Papers
7
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Direct and Indirect Observation of Lithium in a Scanning Electron Microscope; Not Only on Pure Li!
2015
Microscopy and Microanalysis
Pierre Hovington
Marin Lagacé
E. Principe
Simon Burgess
Abdelbast Guerfi
Hendrix Demers
Raynald Gauvin
Karim Zaghib
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Citations (2)
FIB‐SIMS quantification using TOF‐SIMS with Ar and Xe plasma sources
2014
Surface and Interface Analysis
F.A. Stevie
Libor Sedláček
Petr Bábor
Jaroslav Jiruse
E. Principe
K. Klosova
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Citations (5)
1