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O. Matsuzaki
O. Matsuzaki
Hitachi
Analytical chemistry
AND gate
Engineering
Electronic engineering
Voltage
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Increased hot-carrier degradation of NMOSFETs under very fast transient stressing
1991
IRPS | International Reliability Physics Symposium
O. Matsuzaki
Atsuo Watanabe
Masataka Minami
T. Nagano
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