author-photo

Daniel D. Reinhardt

IBM

4

Papers

154

Citations

Citation Trend

Filter By

Papers (4) Sort By

Journal Conference Others

The Impact of Aging Effects and Manufacturing Variation on SRAM Soft-Error Rate

2008 IEEE Transactions on Device and Materials Reliability
Show All
- Source
- Cite
- Save
Citations (53)
Single-event-upset and alpha-particle emission rate measurement techniques

2008 Ibm Journal of Research and Development
Show All
- Source
- Cite
- Save
Citations (16)
Protecting Big Blue from Rogue Subatomic Particles

2007 ICICDT | International Conference on IC Design and Technology
Show All
- Source
- Cite
- Save
Citations (0)
SRAM SER in 90, 130 and 180 nm bulk and SOI technologies

2004 IRPS | International Reliability Physics Symposium
Show All
- Source
- Cite
- Save
Citations (85)