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D. Wakaura
D. Wakaura
University of Toyama
Optics
Materials science
Remanence
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Methodology of Measuring Minute Remanence up to Submicron Tesla Level
2015
Journal of the Japan Society of Applied Electromagnetics and Mechanics
T. Minamitani
D. Wakaura
Sotoshi Yamada
H. Sakai
J. Fujii
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