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Tian Shen
Tian Shen
IBM
Time-dependent gate oxide breakdown
Optoelectronics
Transistor
Nanosheet
Computer science
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TDDB Reliability in Gate-All-Around Nanosheet
2021
IRPS | International Reliability Physics Symposium
Huimei Zhou
Miaomiao Wang
Ruqiang Bao
Tian Shen
Ernest Y. Wu
Richard G. Southwick
Zhang Jingyun
Veeraraghavan S. Basker
Dechao Guo
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BEOL/MOL TDDB Discussion Group
2019
IIRW | International Integrated Reliability Workshop
Tian Shen
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