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Beery Dafna
Beery Dafna
Transistor
Dram
Epitaxy
Materials science
Soft error
2
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6
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0
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On DRAM Rowhammer and the Physics of Insecurity
2021
IEEE Transactions on Electron Devices
Walker Andrew J
Sungkwon Lee
Beery Dafna
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Surround Gate Transistor With Epitaxially Grown Si Pillar and Simulation Study on Soft Error and Rowhammer Tolerance for DRAM
2021
IEEE Transactions on Electron Devices
Jin-Woo Han
JungSik Kim
Beery Dafna
K. Deniz Bozdag
Cuevas Peter
Amitay Levi
Irwin Tain
Khai Tran
Walker Andrew J
Senthil Vadakupudhu Palayam
Antonio Arreghini
Arnaud Furnemont
M. Meyyappan
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Citations (3)
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