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Z.L. Xia
Z.L. Xia
Samsung
Non-volatile memory
Logic gate
Charge-carrier density
Spontaneous emission
Microelectronics
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Local accumulated free carriers in charge trapping memory
2008
SNW | IEEE Silicon Nanoelectronics Workshop
Yuncheng Song
Xiaoyan Liu
K. Zhao
Jinfeng Kang
R.Q. Hant
Z.L. Xia
Dong-Won Kim
K.H. Lee
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