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Robert O’Connor

Katholieke Universiteit Leuven

4

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14

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Impact of nitridation on recoverable and permanent negative bias temperature instability degradation in high-k/metal-gate p-type metal oxide semiconductor field effect transistors

2009 Journal of Vacuum Science & Technology B
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Electron energy dependence of defect generation in high-k gate stacks

2008 Journal of Applied Physics
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Anomalous positive-bias temperature instability of high-κ/metal gate devices with Dy2O3 capping

2008 Applied Physics Letters
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Oxygen-Vacancy-Induced Vt shift in La-containing Devices

2007 The Japan Society of Applied Physics
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