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W. Kim

Samsung

Reliability engineering
Transistor
Limiting
Electronic engineering
Reliability (statistics)

2

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1

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From WLR to product reliability and qualifications in the 3D transistor era

2015 IIRW | International Integrated Reliability Workshop
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Multilayered relaxor ferroelectric poly(vinylidene fluoride-trifluoroethylene-clorotrifluoroethylene) actuators to operate a varifocal liquid-filled microlens

2011 ISE | International Symposium on Electrets
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