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Mickey H. Yu
Mickey H. Yu
IBM
Stress (mechanics)
Electronic engineering
MOSFET
Audio time-scale/pitch modification
Mobility model
2
Papers
5
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0
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A Novel Technique for Probing the Vertical Component of FinFET Source Resistance
2021
IEEE Transactions on Electron Devices
Peng Wang M.D.
Mickey H. Yu
Cave Nigel
Edward J. Nowak
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Modeling gate-pitch scaling impact on stress-induced mobility and external resistance for 20nm-node MOSFETs
2010
SISPAD | International Conference on Simulation of Semiconductor Processes and Devices
Seong-Dong Kim
Sameer H. Jain
Hwasung Rhee
Andreas Scholze
Mickey H. Yu
Seung-Chul Lee
Stephen S. Furkay
Marco Zorzi
F. M. Bufler
Axel Erlebach
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Citations (5)
1