Old Web
English
Sign In
Acemap
>
authorDetail
>
K. Hoppner
K. Hoppner
Advanced Micro Devices
CMOS
Work function
Transistor
Visual defects
Engineering
1
Papers
3
Citations
0
KQI
Citation Trend
Filter By
Interval:
1900~2024
1900
2024
Author
Papers (1)
Sort By
Default
Most Recent
Most Early
Most Citation
No data
Journal
Conference
Others
Novel in-line inspection method for non-visual defects and charging
2009
ASMC | Advanced Semiconductor Manufacturing Conference
K. Hoppner
R. Manuwald
T. Fahr
E. Zschech
N Tamayo
J. Hickson
B Adrian
R. Newcomb
Show All
Source
Cite
Save
Citations (3)
1