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Y. Shutko
Y. Shutko
Beam (structure)
Fluorescence
Optics
Engineering
Electron
3
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Optical spectra from Beam Induced Fluorescence (BIF) profile monitor
2015
Y. Shutko
R. Haseitl
A. Wieser
D. H. Hoffmann
P. Forck
B. Walasek-Höhne
A. Ulrich
T. Sieber
V. Lavrik
P. Boutachkov
S. Udrea
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In-beam tests of PMTs and voltage dividers for particle detectors at FAIR
2015
P. Boutachkov
A. Lieberwirth
E Glück
C. Dorn
H. Bräuning
P. Forck
A. Reiter
Y. Shutko
T. Hoffmann
B. Walasek-Höhne
V. Lavrik
C. Andre
Horst Gräf
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Beam induced fluorescence monitor development: Comparison of image intensified CCD and electron multiplying CCD cameras
2015
Y. Shutko
T. Sieber
V. Lavrik
P. Forck
D. H. Hoffmann
S. Udrea
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