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J. Jeronimo Blostein
J. Jeronimo Blostein
Balseiro Institute
Alpha particle
Physics
Image sensor
Ionizing radiation
CMOS
4
Papers
29
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Displacement Damage in CMOS Image Sensors After Thermal Neutron Irradiation
2018
IEEE Transactions on Nuclear Science
Fabricio Alcalde Bessia
Martin Perez
Miguel Sofo Haro
Ivan Sidelnik
J. Jeronimo Blostein
Sergio Suarez
Pablo Daniel Pérez
Mariano Gomez Berisso
Jose Lipovetzky
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Citations (4)
A Low Cost Environmental Ionizing Radiation Detector Based on COTS CMOS Image Sensors
2018
ARGENCON | IEEE Biennial Congress of Argentina
Clara Lucia Galimberti
Fabricio Alcalde Bessia
Martin Perez
Mariano Gómez Berisso
Miguel Sofo Haro
Iván Sidelnik
J. Jeronimo Blostein
H. Asorey
J. Lipovetzky
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Analysis of SRAM-Based FPGA SEU Sensitivity to Combined EMI and TID-Imprinted Effects
2016
IEEE Transactions on Nuclear Science
Juliano Benfica
Bruno Green
Bruno C. Porcher
Leticia B. Poehls
Fabian Vargas
N. H. Medina
Nemitala Added
Vitor A. P. Aguiar
Eduardo L. A. Macchione
Fernando Aguirre
M. A. G. Silveira
Martin Perez
Miguel Sofo Haro
Iván Sidelnik
J. Jeronimo Blostein
J. Lipovetzky
Eduardo Augusto Bezerra
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Citations (22)
1