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T. Toloshniak
T. Toloshniak
Raman spectroscopy
Crystallinity
Annealing (metallurgy)
Analytical chemistry
Thin film
3
Papers
13
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First results of humidity sensors based on CeO2 thick film deposited by a new deposition technique from a suspension of nanoparticles
2019
Microelectronic Engineering
T. Toloshniak
Y. Guhel
A. Besq
B. Boudart
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Citations (6)
Rapid thermal annealing of cerium dioxide thin films sputtered onto silicon (111) substrates: Influence of heating rate on microstructure and electrical properties
2015
Materials Science in Semiconductor Processing
Y. Guhel
T. Toloshniak
Jérôme Bernard
A. Besq
R. Coq Germanicus
J. El Fallah
J.C. Pesant
Philippe Descamps
B. Boudart
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Citations (5)
Impact of microwave annealing on CeO2 thin films sputtered on (1 1 1) Si
2015
Materials Research Bulletin
T. Toloshniak
Y. Guhel
Jérôme Bernard
A. Besq
S. Marinel
B. Boudart
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Citations (2)
1