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L. Lonzi
L. Lonzi
STMicroelectronics
Electromigration
Heating element
Electronic engineering
Engineering
Electrical measurements
1
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3
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Design of a test structure to evaluate electro-thermomigration in power ICs
1996
Microelectronics Reliability
I. De Munari
F. Speroni
M. Reverberi
C. Neva
L. Lonzi
F. Fantini
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Citations (3)
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