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G. Skyles
G. Skyles
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Manufacturing engineering
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Integrated test facility (ITF)-automation testing to support Intel's manufacturing output
1997
ISSM | International Symposium on Semiconductor Manufacturing
J. Bisgrove
R. Dayao
B. Houser
T Jones
J.C. Mayes
M. McGinnis
M. Schmidt
G. Skyles
B. K. Tan
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Citations (4)
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