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Christoph Schreiber
Christoph Schreiber
Infineon Technologies
Electronic engineering
Engineering
Electrical engineering
Field-programmable gate array
Stress testing
4
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40
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A reliable technology concept for active power cycling to extreme temperatures
2011
Microelectronics Reliability
Michael Nelhiebel
Robert Illing
Christoph Schreiber
Stefan Wöhlert
Sven Gustav Lanzerstorfer
Markus Ladurner
Christoph Kadow
Stefan Decker
Donald Dibra
H. Unterwalcher
Michael Rogalli
Werner Robl
T. Herzig
M. Poschgan
M. Inselsbacher
Michael Glavanovics
Sylvain Fraïssé
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Citations (28)
Closed loop temperature and repetition rate control for accelerated pulse stress testing of smart power switches
2009
EPE | European Conference on Power Electronics and Applications
Hans-Peter Kreuter
Michael Glavanovics
Christoph Schreiber
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Citations (1)
Cycle stress test equipment for automated short circuit testing of smart power switches according to the AEC Q100-012 standard
2009
EPE | European Conference on Power Electronics and Applications
Michael Glavanovics
Hans-Peter Kreuter
Roland Sleik
Christoph Schreiber
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Citations (6)
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