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Seong Yeol Yoo
Seong Yeol Yoo
Kyung Hee University
Crystallization
Thin-film transistor
Field effect
Analytical chemistry
Polycrystalline silicon
2
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8
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P‐4: SPC Poly‐Si TFT Having a Maximum Process Temperature of 380°C
2001
Seong Jin Park
Bong Rae Cho
Kyung Ho Kim
Kyu Sik Cho
Seong Yeol Yoo
Ah-Young Kim
Jin Jang
Dong Hyuk Shin
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Citations (5)
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